On-wafer noise characterization of low-noise amplifiers in the Ka-band

Sabine Long, Laurent Escotte, Jacques Graffeuil, F. Brasseau, J. L. Cazaux. On-wafer noise characterization of low-noise amplifiers in the Ka-band. IEEE T. Instrumentation and Measurement, 52(5):1606-1610, 2003. [doi]

Abstract

Abstract is missing.