A Unified Electrothermal Behavior Modeling Method for Both SiC MOSFET and GaN HEMT

Xiao Long, Zhao Jun, Botao Zhang, Dongdong Chen, Wu Liang. A Unified Electrothermal Behavior Modeling Method for Both SiC MOSFET and GaN HEMT. IEEE Transactions on Industrial Electronics, 68(10):9366-9375, 2021. [doi]

Abstract

Abstract is missing.