Bing Long, Shulin Tian, Houjun Wang. Feature Vector Selection Method Using Mahalanobis Distance for Diagnostics of Analog Circuits Based on LS-SVM. J. Electronic Testing, 28(5):745-755, 2012. [doi]
@article{LongTW12a,
title = {Feature Vector Selection Method Using Mahalanobis Distance for Diagnostics of Analog Circuits Based on LS-SVM},
author = {Bing Long and Shulin Tian and Houjun Wang},
year = {2012},
doi = {10.1007/s10836-012-5301-8},
url = {http://dx.doi.org/10.1007/s10836-012-5301-8},
researchr = {https://researchr.org/publication/LongTW12a},
cites = {0},
citedby = {0},
journal = {J. Electronic Testing},
volume = {28},
number = {5},
pages = {745-755},
}