Cascaded Approach to Defect Location and Classification in Microelectronic Bonded Joints: Improved Level Set and Random Forest

Zhili Long, Xing Zhou, Xiaojun Wu. Cascaded Approach to Defect Location and Classification in Microelectronic Bonded Joints: Improved Level Set and Random Forest. IEEE Trans. Industrial Informatics, 16(7):4403-4412, 2020. [doi]

Abstract

Abstract is missing.