Robust Synchronization of Motion in Wafer Scanners Using Particle Swarm Optimization

Vincent A. Looijen, Marcel François Heertjes. Robust Synchronization of Motion in Wafer Scanners Using Particle Swarm Optimization. In IEEE Conference on Control Technology and Applications, CCTA 2018, Copenhagen, Denmark, August 21-24, 2018. pages 1102-1107, IEEE, 2018. [doi]

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