Nondestructive high-throughput sugar beet fruit analysis using X-ray CT and deep learning - researchr publication

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Tim Van De Looverbosch, Bert Vandenbussche, Pieter Verboven, Bart M. Nicolaï. Nondestructive high-throughput sugar beet fruit analysis using X-ray CT and deep learning. Computers and Electronics in Agriculture, 200:107228, 2022. [doi]

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