How complex is my Product Line? The case for Variation Point Metrics

Roberto E. Lopez-Herrejon, Salvador Trujillo. How complex is my Product Line? The case for Variation Point Metrics. In Patrick Heymans, Kyo Chul Kang, Andreas Metzger, Klaus Pohl, editors, Second International Workshop on Variability Modelling of Software-Intensive Systems, Universität Duisburg-Essen, Germany, January 16-18, 2008, Proceedings. ICB Research Report, pages 97-100, 2008. [doi]

Abstract

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