Fernando López, José Miguel Valiente, Ramón Baldrich, María Vanrell. Fast Surface Grading Using Color Statistics in the CIE Lab Space. In Jorge S. Marques, Nicolas Pérez de la Blanca, Pedro Pina, editors, Pattern Recognition and Image Analysis, Second Iberian Conference, IbPRIA 2005, Estoril, Portugal, June 7-9, 2005, Proceedings, Part II. Volume 3523 of Lecture Notes in Computer Science, pages 666-673, Springer, 2005. [doi]
Abstract is missing.