Joe Lorentz, Thomas Hartmann 0001, Assaad Moawad, Djamila Aouada. Industrial defect detection on the edge with deep learning over scarcely labeled and extremely imbalanced data. In IEEE International Conference on Omni-layer Intelligent Systems, COINS 2023, Berlin, Germany, July 23-25, 2023. pages 1-6, IEEE, 2023. [doi]
Abstract is missing.