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Explaining Defect Detection with Saliency Maps

Joe Lorentz, Thomas Hartmann 0001, Assaad Moawad, François Fouquet, Djamila Aouada. Explaining Defect Detection with Saliency Maps. In Hamido Fujita, Ali Selamat, Jerry Chun-Wei Lin, Moonis Ali, editors, Advances and Trends in Artificial Intelligence. From Theory to Practice - 34th International Conference on Industrial, Engineering and Other Applications of Applied Intelligent Systems, IEA/AIE 2021, Kuala Lumpur, Malaysia, July 26-29, 2021, Proceedings, Part II. Volume 12799 of Lecture Notes in Computer Science, pages 506-518, Springer, 2021. [doi]

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Joe Lorentz

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Thomas Hartmann 0001

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Assaad Moawad

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François Fouquet

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Djamila Aouada

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