Explaining Defect Detection with Saliency Maps

Joe Lorentz, Thomas Hartmann 0001, Assaad Moawad, François Fouquet, Djamila Aouada. Explaining Defect Detection with Saliency Maps. In Hamido Fujita, Ali Selamat, Jerry Chun-Wei Lin, Moonis Ali, editors, Advances and Trends in Artificial Intelligence. From Theory to Practice - 34th International Conference on Industrial, Engineering and Other Applications of Applied Intelligent Systems, IEA/AIE 2021, Kuala Lumpur, Malaysia, July 26-29, 2021, Proceedings, Part II. Volume 12799 of Lecture Notes in Computer Science, pages 506-518, Springer, 2021. [doi]

@inproceedings{LorentzHMFA21,
  title = {Explaining Defect Detection with Saliency Maps},
  author = {Joe Lorentz and Thomas Hartmann 0001 and Assaad Moawad and François Fouquet and Djamila Aouada},
  year = {2021},
  doi = {10.1007/978-3-030-79463-7_43},
  url = {https://doi.org/10.1007/978-3-030-79463-7_43},
  researchr = {https://researchr.org/publication/LorentzHMFA21},
  cites = {0},
  citedby = {0},
  pages = {506-518},
  booktitle = {Advances and Trends in Artificial Intelligence. From Theory to Practice - 34th International Conference on Industrial, Engineering and Other Applications of Applied Intelligent Systems, IEA/AIE 2021, Kuala Lumpur, Malaysia, July 26-29, 2021, Proceedings, Part II},
  editor = {Hamido Fujita and Ali Selamat and Jerry Chun-Wei Lin and Moonis Ali},
  volume = {12799},
  series = {Lecture Notes in Computer Science},
  publisher = {Springer},
  isbn = {978-3-030-79463-7},
}