Monitoring of aging in integrated circuits by identifying possible critical paths

Dominik Lorenz, Martin Barke, Ulf Schlichtmann. Monitoring of aging in integrated circuits by identifying possible critical paths. Microelectronics Reliability, 54(6-7):1075-1082, 2014. [doi]

Authors

Dominik Lorenz

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Martin Barke

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Ulf Schlichtmann

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