Dominik Lorenz, Martin Barke, Ulf Schlichtmann. Monitoring of aging in integrated circuits by identifying possible critical paths. Microelectronics Reliability, 54(6-7):1075-1082, 2014. [doi]
@article{LorenzBS14,
title = {Monitoring of aging in integrated circuits by identifying possible critical paths},
author = {Dominik Lorenz and Martin Barke and Ulf Schlichtmann},
year = {2014},
doi = {10.1016/j.microrel.2014.01.013},
url = {http://dx.doi.org/10.1016/j.microrel.2014.01.013},
researchr = {https://researchr.org/publication/LorenzBS14},
cites = {0},
citedby = {0},
journal = {Microelectronics Reliability},
volume = {54},
number = {6-7},
pages = {1075-1082},
}