Marco Lormans, Arie van Deursen. Reconstructing requirements coverage views from design and test using traceability recovery via LSI. In Jonathan I. Maletic, Jane Cleland-Huang, Jane Huffman Hayes, Giuliano Antoniol, editors, The 3rd International Workshop on Traceability in Emerging Forms of Software Engineering, co-located with the ASE 2005 Conference, TEFSE@ASE 2005, Long Beach, CA, USA, November 88, 2005. pages 37-42, ACM, 2005. [doi]
Abstract is missing.