Len Losik. Eliminating product infant mortality failures using prognostic analysis. In Gordon W. Roberts, Bill Eklow, editors, 2009 IEEE International Test Conference, ITC 2009, Austin, TX, USA, November 1-6, 2009. pages 1, IEEE, 2009. [doi]
@inproceedings{Losik09, title = {Eliminating product infant mortality failures using prognostic analysis}, author = {Len Losik}, year = {2009}, doi = {10.1109/TEST.2009.5355817}, url = {http://dx.doi.org/10.1109/TEST.2009.5355817}, researchr = {https://researchr.org/publication/Losik09}, cites = {0}, citedby = {0}, pages = {1}, booktitle = {2009 IEEE International Test Conference, ITC 2009, Austin, TX, USA, November 1-6, 2009}, editor = {Gordon W. Roberts and Bill Eklow}, publisher = {IEEE}, isbn = {978-1-4244-4868-5}, }