Intelligible models for classification and regression

Yin Lou, Rich Caruana, Johannes Gehrke. Intelligible models for classification and regression. In Qiang Yang, Deepak Agarwal, Jian Pei, editors, The 18th ACM SIGKDD International Conference on Knowledge Discovery and Data Mining, KDD '12, Beijing, China, August 12-16, 2012. pages 150-158, ACM, 2012. [doi]

Abstract

Abstract is missing.