Surface roughness characterization for SAR applications

Jérôme M. B. Louis, Nicolas Floury, Malcolm Davidson, Evert Attema, Maurice Borgeaud. Surface roughness characterization for SAR applications. In 2003 IEEE International Geoscience and Remote Sensing Symposium, IGARSS 2003, Toulouse, France, July 21-15, 2003. pages 1408-1410, IEEE, 2003. [doi]

@inproceedings{LouisFDAB03,
  title = {Surface roughness characterization for SAR applications},
  author = {Jérôme M. B. Louis and Nicolas Floury and Malcolm Davidson and Evert Attema and Maurice Borgeaud},
  year = {2003},
  doi = {10.1109/IGARSS.2003.1294125},
  url = {https://doi.org/10.1109/IGARSS.2003.1294125},
  researchr = {https://researchr.org/publication/LouisFDAB03},
  cites = {0},
  citedby = {0},
  pages = {1408-1410},
  booktitle = {2003 IEEE International Geoscience and Remote Sensing Symposium, IGARSS 2003, Toulouse, France, July 21-15, 2003},
  publisher = {IEEE},
  isbn = {0-7803-7929-2},
}