Jérôme M. B. Louis, Nicolas Floury, Malcolm Davidson, Evert Attema, Maurice Borgeaud. Surface roughness characterization for SAR applications. In 2003 IEEE International Geoscience and Remote Sensing Symposium, IGARSS 2003, Toulouse, France, July 21-15, 2003. pages 1408-1410, IEEE, 2003. [doi]
Abstract is missing.