PA&DA: Jointly Sampling PAth and DAta for Consistent NAS

Shun Lu, Yu Hu 0001, Longxing Yang, Zihao Sun, Jilin Mei, Jianchao Tan, Chengru Song. PA&DA: Jointly Sampling PAth and DAta for Consistent NAS. In IEEE/CVF Conference on Computer Vision and Pattern Recognition, CVPR 2023, Vancouver, BC, Canada, June 17-24, 2023. pages 11940-11949, IEEE, 2023. [doi]

Abstract

Abstract is missing.