Cunwei Lu, Genki Cho. Practical 3-D Shape Measurement Using Optimal Intensity-Modulated Projection and Intensity-Phase Analysis Techniques. In 18th International Conference on Pattern Recognition (ICPR 2006), 20-24 August 2006, Hong Kong, China. pages 870-873, IEEE Computer Society, 2006. [doi]
@inproceedings{LuC06a:0, title = {Practical 3-D Shape Measurement Using Optimal Intensity-Modulated Projection and Intensity-Phase Analysis Techniques}, author = {Cunwei Lu and Genki Cho}, year = {2006}, doi = {10.1109/ICPR.2006.940}, url = {http://doi.ieeecomputersociety.org/10.1109/ICPR.2006.940}, tags = {analysis}, researchr = {https://researchr.org/publication/LuC06a%3A0}, cites = {0}, citedby = {0}, pages = {870-873}, booktitle = {18th International Conference on Pattern Recognition (ICPR 2006), 20-24 August 2006, Hong Kong, China}, publisher = {IEEE Computer Society}, isbn = {0-7695-2521-0}, }