Shyue-Kung Lu, Chih-Hsien Hsu. Built-In self-repair for divided word line memory. In International Symposium on Circuits and Systems (ISCAS 2001), 6-9 May 2001, Sydney, Australia. pages 13-16, IEEE, 2001. [doi]
@inproceedings{LuH01:0,
title = {Built-In self-repair for divided word line memory},
author = {Shyue-Kung Lu and Chih-Hsien Hsu},
year = {2001},
doi = {10.1109/ISCAS.2001.922156},
url = {http://doi.ieeecomputersociety.org/10.1109/ISCAS.2001.922156},
researchr = {https://researchr.org/publication/LuH01%3A0},
cites = {0},
citedby = {0},
pages = {13-16},
booktitle = {International Symposium on Circuits and Systems (ISCAS 2001), 6-9 May 2001, Sydney, Australia},
publisher = {IEEE},
isbn = {0-7803-6685-9},
}