Built-In self-repair for divided word line memory

Shyue-Kung Lu, Chih-Hsien Hsu. Built-In self-repair for divided word line memory. In International Symposium on Circuits and Systems (ISCAS 2001), 6-9 May 2001, Sydney, Australia. pages 13-16, IEEE, 2001. [doi]

No reviews for this publication, yet.