Intelligent Process Trend Recognition Fault Diagnosis and Industrial Application

Sien Lu, Biao Huang. Intelligent Process Trend Recognition Fault Diagnosis and Industrial Application. In De-Shuang Huang, Kang Li, George W. Irwin, editors, Computational Intelligence, International Conference on Intelligent Computing, ICIC 2006, Kunming, China, August 16-19, 2006. Proceedings, Part II. Volume 4114 of Lecture Notes in Computer Science, pages 637-642, Springer, 2006. [doi]

Abstract

Abstract is missing.