Shun-Yen Lu, Ming-Ting Hsieh, Jing-Jia Liou. An efficient SAT-based path delay fault ATPG with an unified sensitization model. In Jill Sibert, Janusz Rajski, editors, 2007 IEEE International Test Conference, ITC 2007, Santa Clara, California, USA, October 21-26, 2007. pages 1-7, IEEE, 2007. [doi]
Abstract is missing.