Anni Lu, Jae Hur, Yuan-Chun Luo, Hai Li, Dmitri E. Nikonov, Ian A. Young, Yang-Kyu Choi, Shimeng Yu. Scalable In-Memory Clustered Annealer With Temporal Noise of Charge Trap Transistor for Large Scale Travelling Salesman Problems. IEEE J. Emerg. Sel. Topics Circuits Syst., 13(1):422-435, March 2023. [doi]
Abstract is missing.