Zhijian Lu, Wei Huang, Mircea R. Stan, Kevin Skadron, John Lach. Interconnect Lifetime Prediction for Reliability-Aware Systems. IEEE Trans. VLSI Syst., 15(2):159-172, 2007. [doi]
@article{LuHSSL07,
title = {Interconnect Lifetime Prediction for Reliability-Aware Systems},
author = {Zhijian Lu and Wei Huang and Mircea R. Stan and Kevin Skadron and John Lach},
year = {2007},
doi = {10.1109/TVLSI.2007.893578},
url = {http://dx.doi.org/10.1109/TVLSI.2007.893578},
tags = {context-aware, reliability},
researchr = {https://researchr.org/publication/LuHSSL07},
cites = {0},
citedby = {0},
journal = {IEEE Trans. VLSI Syst.},
volume = {15},
number = {2},
pages = {159-172},
}