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ReRAM Device and Circuit Co-Design Challenges in Nano-scale CMOS Technology

Lu Lu, Ju Eon Kim, Vishal Sharma, Tony Tae-Hyoung Kim. ReRAM Device and Circuit Co-Design Challenges in Nano-scale CMOS Technology. In 2020 IEEE Asia Pacific Conference on Circuits and Systems, APCCAS 2020, Ha Long, Vietnam, December 8-10, 2020. pages 213-216, IEEE, 2020. [doi]

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