A Programmable Online/Off-line Built-in Self-test Scheme for RAMs with ECC

Hsing-Chen Lu, Jin-Fu Li. A Programmable Online/Off-line Built-in Self-test Scheme for RAMs with ECC. In International Symposium on Circuits and Systems (ISCAS 2009), 24-17 May 2009, Taipei, Taiwan. pages 1997-2000, IEEE, 2009. [doi]

Abstract

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