Yang Lu, Fabrizio Lombardi, Salvatore Pontarelli, Marco Ottavi. On the design of two single event tolerant slave latches for scan delay testing. In 2012 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT 2012, Austin, TX, USA, October 3-5, 2012. pages 67-72, IEEE Computer Society, 2012. [doi]
@inproceedings{LuLPO12,
title = {On the design of two single event tolerant slave latches for scan delay testing},
author = {Yang Lu and Fabrizio Lombardi and Salvatore Pontarelli and Marco Ottavi},
year = {2012},
doi = {10.1109/DFT.2012.6378202},
url = {http://doi.ieeecomputersociety.org/10.1109/DFT.2012.6378202},
researchr = {https://researchr.org/publication/LuLPO12},
cites = {0},
citedby = {0},
pages = {67-72},
booktitle = {2012 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT 2012, Austin, TX, USA, October 3-5, 2012},
publisher = {IEEE Computer Society},
isbn = {978-1-4673-3043-5},
}