Yue Lu, Thomas Nolte, Iain Bate, Johan Kraft, Christer Norström. Assessment of trace-differences in timing analysis for Complex Real-Time Embedded Systems. In Industrial Embedded Systems (SIES), 2011 6th IEEE International Symposium on, Vasteras, Sweden, 15-17 June, 2011. pages 284-293, IEEE, 2011. [doi]
Abstract is missing.