Shyue-Kung Lu, Jeh-Sheng Shih, Cheng-Wen Wu. A Testable/Fault Tolerant FFT Processor Design. In 9th Asian Test Symposium (ATS 2000), 4-6 December 2000, Taipei, Taiwan. pages 429, IEEE Computer Society, 2000. [doi]
@inproceedings{LuSW00,
title = {A Testable/Fault Tolerant FFT Processor Design},
author = {Shyue-Kung Lu and Jeh-Sheng Shih and Cheng-Wen Wu},
year = {2000},
url = {http://csdl.computer.org/comp/proceedings/ats/2000/0887/00/08870429abs.htm},
tags = {testing, design},
researchr = {https://researchr.org/publication/LuSW00},
cites = {0},
citedby = {0},
pages = {429},
booktitle = {9th Asian Test Symposium (ATS 2000), 4-6 December 2000, Taipei, Taiwan},
publisher = {IEEE Computer Society},
isbn = {0-7695-0887-1},
}