A Testable/Fault Tolerant FFT Processor Design

Shyue-Kung Lu, Jeh-Sheng Shih, Cheng-Wen Wu. A Testable/Fault Tolerant FFT Processor Design. In 9th Asian Test Symposium (ATS 2000), 4-6 December 2000, Taipei, Taiwan. pages 429, IEEE Computer Society, 2000. [doi]

Abstract

Abstract is missing.