Multiple Fault Detection in CMOS Logic Circuits

Ding Lu, Carol Q. Tong. Multiple Fault Detection in CMOS Logic Circuits. In Proceedings 1991 IEEE International Conference on Computer Design: VLSI in Computer & Processors, ICCD 92, Cambridge, MA, USA, October 11-14, 1992. pages 373-376, IEEE Computer Society, 1992.

@inproceedings{LuT92:0,
  title = {Multiple Fault Detection in CMOS Logic Circuits},
  author = {Ding Lu and Carol Q. Tong},
  year = {1992},
  tags = {logic},
  researchr = {https://researchr.org/publication/LuT92%3A0},
  cites = {0},
  citedby = {0},
  pages = {373-376},
  booktitle = {Proceedings 1991 IEEE International Conference on Computer Design: VLSI in Computer & Processors, ICCD  92, Cambridge, MA, USA, October 11-14, 1992},
  publisher = {IEEE Computer Society},
  isbn = {0-8186-3110-4},
}