Cost and Benefit Models for Logic and Memory BIST

Juin-Ming Lu, Cheng-Wen Wu. Cost and Benefit Models for Logic and Memory BIST. In 2000 Design, Automation and Test in Europe (DATE 2000), 27-30 March 2000, Paris, France. pages 710-714, IEEE Computer Society, 2000. [doi]

Authors

Juin-Ming Lu

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Cheng-Wen Wu

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