Cost and Benefit Models for Logic and Memory BIST

Juin-Ming Lu, Cheng-Wen Wu. Cost and Benefit Models for Logic and Memory BIST. In 2000 Design, Automation and Test in Europe (DATE 2000), 27-30 March 2000, Paris, France. pages 710-714, IEEE Computer Society, 2000. [doi]

@inproceedings{LuW00:0,
  title = {Cost and Benefit Models for Logic and Memory BIST},
  author = {Juin-Ming Lu and Cheng-Wen Wu},
  year = {2000},
  url = {http://csdl.computer.org/comp/proceedings/date/2000/0537/00/05370710abs.htm},
  tags = {logic},
  researchr = {https://researchr.org/publication/LuW00%3A0},
  cites = {0},
  citedby = {0},
  pages = {710-714},
  booktitle = {2000 Design, Automation and Test in Europe (DATE 2000), 27-30 March 2000, Paris, France},
  publisher = {IEEE Computer Society},
  isbn = {0-7695-0537-6},
}