Shyue-Kung Lu, Yu-Sheng Wu, Jin-Hua Hong, Kohei Miyase. Fault Resilience Techniques for Flash Memory of DNN Accelerators. In IEEE International Test Conference in Asia, ITC-Asia 2022, Taipei, Taiwan, August 24-26, 2022. pages 1-6, IEEE, 2022. [doi]
@inproceedings{LuWHM22,
title = {Fault Resilience Techniques for Flash Memory of DNN Accelerators},
author = {Shyue-Kung Lu and Yu-Sheng Wu and Jin-Hua Hong and Kohei Miyase},
year = {2022},
doi = {10.1109/ITCAsia55616.2022.00011},
url = {https://doi.org/10.1109/ITCAsia55616.2022.00011},
researchr = {https://researchr.org/publication/LuWHM22},
cites = {0},
citedby = {0},
pages = {1-6},
booktitle = {IEEE International Test Conference in Asia, ITC-Asia 2022, Taipei, Taiwan, August 24-26, 2022},
publisher = {IEEE},
isbn = {978-1-6654-5523-7},
}