Qiwei Lu, Tao Wang, Bangbang He, Tao Ru, Dawei Chen. A new series arc fault identification method based on wavelet transform. In IECON 2017 - 43rd Annual Conference of the IEEE Industrial Electronics Society, Beijing, China, October 29 - November 1, 2017. pages 4817-4822, IEEE, 2017. [doi]
Abstract is missing.