Fanbin Lu, Xufeng Yao, Chi-Wing Fu, Jiaya Jia. Removing Anomalies as Noises for Industrial Defect Localization. In IEEE/CVF International Conference on Computer Vision, ICCV 2023, Paris, France, October 1-6, 2023. pages 16120-16129, IEEE, 2023. [doi]
Abstract is missing.