Efficient Built-in Self-Test Techniques for Memory-Based FFT Processors

Shyue-Kung Lu, Chien-Hung Yeh, Han-Wen Lin. Efficient Built-in Self-Test Techniques for Memory-Based FFT Processors. In 10th IEEE Pacific Rim International Symposium on Dependable Computing (PRDC 2004), 3-5 March 2004, Papeete, Tahiti. pages 321-326, IEEE Computer Society, 2004. [doi]

Abstract

Abstract is missing.