Xu Lu, Yonggui Yuan, Chi Ma, Haibo Zhu, Yunlong Zhu, Zhangjun Yu, Xiaojun Zhang, Fuqiang Jiang, Jianzhong Zhang, Hanyang Li, Jun Yang 0024, Libo Yuan. Self-Calibrated Absolute Thickness Measurement of Opaque Specimen Based on Differential White Light Interferometry. IEEE T. Instrumentation and Measurement, 69(5):2507-2514, 2020. [doi]
Abstract is missing.