Explore Deep Feature Learning to Power Equipment Monitoring and Defect Detection

Xiaoxiong Lu, Jie Zhang, Kaihua Chen, Mini Wu, Qingxue Li, Xiaomeng Yu. Explore Deep Feature Learning to Power Equipment Monitoring and Defect Detection. In HP3C 2022: 6th International Conference on High Performance Compilation, Computing and Communications, Virtual Event, China, June 23-25, 2022. pages 144-149, ACM, 2022. [doi]

Authors

Xiaoxiong Lu

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Jie Zhang

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Kaihua Chen

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Mini Wu

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Qingxue Li

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Xiaomeng Yu

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