Xiaoxiong Lu, Jie Zhang, Kaihua Chen, Mini Wu, Qingxue Li, Xiaomeng Yu. Explore Deep Feature Learning to Power Equipment Monitoring and Defect Detection. In HP3C 2022: 6th International Conference on High Performance Compilation, Computing and Communications, Virtual Event, China, June 23-25, 2022. pages 144-149, ACM, 2022. [doi]
Abstract is missing.