Shyue-Kung Lu, Shang-Xiu Zhong, Masaki Hashizume. Fault Leveling Techniques for Yield and Reliability Enhancement of NAND Flash Memories. J. Electronic Testing, 34(5):559-570, 2018. [doi]
@article{LuZH18-1,
title = {Fault Leveling Techniques for Yield and Reliability Enhancement of NAND Flash Memories},
author = {Shyue-Kung Lu and Shang-Xiu Zhong and Masaki Hashizume},
year = {2018},
doi = {10.1007/s10836-018-5752-7},
url = {https://doi.org/10.1007/s10836-018-5752-7},
researchr = {https://researchr.org/publication/LuZH18-1},
cites = {0},
citedby = {0},
journal = {J. Electronic Testing},
volume = {34},
number = {5},
pages = {559-570},
}