Gerald Lucovsky, H. Seo, L. B. Fleming, M. D. Ulrich, J. Lüning, Patrick Lysaght, Gennadi Bersuker. Intrinsic bonding defects in transition metal elemental oxides. Microelectronics Reliability, 46(9-11):1623-1628, 2006. [doi]
@article{LucovskySFULLB06,
title = {Intrinsic bonding defects in transition metal elemental oxides},
author = {Gerald Lucovsky and H. Seo and L. B. Fleming and M. D. Ulrich and J. Lüning and Patrick Lysaght and Gennadi Bersuker},
year = {2006},
doi = {10.1016/j.microrel.2006.07.032},
url = {http://dx.doi.org/10.1016/j.microrel.2006.07.032},
researchr = {https://researchr.org/publication/LucovskySFULLB06},
cites = {0},
citedby = {0},
journal = {Microelectronics Reliability},
volume = {46},
number = {9-11},
pages = {1623-1628},
}