Intrinsic bonding defects in transition metal elemental oxides

Gerald Lucovsky, H. Seo, L. B. Fleming, M. D. Ulrich, J. Lüning, Patrick Lysaght, Gennadi Bersuker. Intrinsic bonding defects in transition metal elemental oxides. Microelectronics Reliability, 46(9-11):1623-1628, 2006. [doi]

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