G. K. Lukianoff, J. S. Wolcott, Joan M. Morrissey. Electron-Beam Testing of VLSI Dyrnamic RAMs. In Proceedings International Test Conference 1981, Philadelphia, PA, USA, October 1981. pages 68-78, IEEE Computer Society, 1981.
@inproceedings{LukianoffWM81,
title = {Electron-Beam Testing of VLSI Dyrnamic RAMs},
author = {G. K. Lukianoff and J. S. Wolcott and Joan M. Morrissey},
year = {1981},
tags = {testing},
researchr = {https://researchr.org/publication/LukianoffWM81},
cites = {0},
citedby = {0},
pages = {68-78},
booktitle = {Proceedings International Test Conference 1981, Philadelphia, PA, USA, October 1981},
publisher = {IEEE Computer Society},
}