Kent Lunneborg. A Unified Test Plan for LSI or VLSI Components. In Proceedings International Test Conference 1981, Philadelphia, PA, USA, October 1981. pages 9-14, IEEE Computer Society, 1981.
@inproceedings{Lunneborg81,
title = {A Unified Test Plan for LSI or VLSI Components},
author = {Kent Lunneborg},
year = {1981},
tags = {testing},
researchr = {https://researchr.org/publication/Lunneborg81},
cites = {0},
citedby = {0},
pages = {9-14},
booktitle = {Proceedings International Test Conference 1981, Philadelphia, PA, USA, October 1981},
publisher = {IEEE Computer Society},
}