Yuetong Luo, Jingshuai Bian, Meng Zhang, Yongming Rao, Feng Yan. 基于卷积去噪自编码器的芯片表面弱缺陷检测方法 (Detection Method of Chip Surface Weak Defect Based on Convolution Denoising Auto-encoders). 计算机科学, 47(2):118-125, 2020. [doi]
@article{LuoBZRY20,
title = {基于卷积去噪自编码器的芯片表面弱缺陷检测方法 (Detection Method of Chip Surface Weak Defect Based on Convolution Denoising Auto-encoders)},
author = {Yuetong Luo and Jingshuai Bian and Meng Zhang and Yongming Rao and Feng Yan},
year = {2020},
doi = {10.11896/jsjkx.190100141},
url = {https://doi.org/10.11896/jsjkx.190100141},
researchr = {https://researchr.org/publication/LuoBZRY20},
cites = {0},
citedby = {0},
journal = {计算机科学},
volume = {47},
number = {2},
pages = {118-125},
}