Yuhuan Luo, Xiuqin Chu, Haiyue Yuan, Tao Wei, Yuhao Huang, Jun Wang 0034, Feng Wu 0005, Yushan Li 0003. A New Methodology for Calculating the Statistical Distribution of Power Supply Noise in Chip-Package-PCB Co-Design. IEEE T. Instrumentation and Measurement, 74:1-13, 2025. [doi]
Abstract is missing.