Yixin Luo, Saugata Ghose, Yu Cai, Erich F. Haratsch, Onur Mutlu. Improving 3D NAND Flash Memory Lifetime by Tolerating Early Retention Loss and Process Variation. In Konstantinos Psounis, Aditya Akella, Adam Wierman, editors, Abstracts of the 2018 ACM International Conference on Measurement and Modeling of Computer Systems, SIGMETRICS 2018, Irvine, CA, USA, June 18-22, 2018. pages 106, ACM, 2018. [doi]
Abstract is missing.